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/Testing, or in Artificial Intelligence. Requirements Research FieldComputer science » OtherEducation LevelBachelor Degree or equivalent Skills/Qualifications Candidates must hold a UK bachelor’s degree with
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PhD: Metrology and Process Integration for Defect Mapping of Next Generation Semiconductor Materials and Devices This PhD project will harness the power of Artificial Intelligence for application in
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manually examining through the acquired volumetric data. Artificial intelligence (AI) has emerged as a promising solution to automate and enhance defect detection in these complex structural data. The aim
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